Japan JIMA resolution test chart

JapanJIMA resolution test card

JIMA (Japan Inspection Instrument Manufacturers Association) is committed to focusing on various inspection instruments, including non-destructive testing instruments, JIMA resolution test cards, which are used to measure the resolution of X-ray systems to ensure the image quality of X-ray systems at micron and nanofocus.

JIMA RT CT-01Resolution test chart (dedicated to 3DCT system resolution test)

The test card is packaged in a protective box

Pattern layout:T type

line/Space size: 5 specifications and patterns

3μm, 4μm, 5μm, 6μm, 7μm

JIMA RT CT-02Resolution test chart

The test card is packaged in a protective box

The overall dimensions of the box (W x D x T）：40 x 30 x 5mm

Chip size (W x D x T）：5 x 5 x 0.06mm

Pattern layout:L type

line/Space size: 16 specifications and patterns

0.4μm, 0.5μm, 0.6μm, 0.7μm, 0.8μm, 0.9μm, 1.0μm, 1.5μm,

2.0μm, 3.0μm, 4.0μm, 5.0μm, 6.0μm, 7.0μm, 10.0μm, 15.0μm

JIMA RT CT-04Resolution test chart

The test card is packaged in a protective box

The overall dimensions of the box (W x D x T）：40 x 30 x 5mm

Chip size (W x D x T）：5 x 5 x 0.015mm

Pattern layout:T type

line/Space size: 32 specifications and patterns

0.1μm, 0.15μm, 0.2μm, 0.25μm, 0.3μm, 0.35μm, 0.4μm, 0.5μm, 0.6μm, 0.7μm, 0.8μm,

0.9μm, 1.0μm, 1.5μm, 2.0μm, 3.0μm, 4.0μm, 5.0μm, 6.0μm, 7.0μm, 8.0μm, 9.0μm, 10.0μm

JIMA RT CT-05Resolution test chart

The test card is packaged in a protective box

The overall dimensions of the box (W x D x T）：40 x 30 x 3mm

Chip size (W x D x T）：8 x 8 x 0.2mm

Pattern layout: T type (3-10μm)

          Type I (15-50μm)

line/Space size: 16 specifications and patterns

3.0μm, 4.0μm, 5.0μm, 6.0μm, 7.0μm, 8.0μm, 9.0μm, 10.0μm (T type)

15μm, 20μm, 25μm, 30μm, 35μm, 40μm, 45μm, 50μm (Type I)