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Detailed introduction
Zero Dead Time (ZDT) - lossless count correction
Count rate changing too quickly? Need to calculate uncertainty? ZDT is yours!
ZDT is an alternative to traditional live time expansion and can correct dead time. It is particularly suitable for applications where the count rate decays significantly during acquisition (such as neutron activation analysis), or where activity surges during long acquisitions (such as hot particle situations in stack monitoring).
Live time clocks extend the counting time of electronic devices to compensate for dead time. Lossless counting methods, like our ZDT, correct for those counts while the system processes other pulses, "losing" the actual number of counts in the spectrum. The ZDT method uses ORTEC's highly accurate Gedcke-Hale clock to determine how many events should be added during the electronic device's "dead" time.
In ZDT mode, DSPEC jr 2.0 automatically stores the corrected spectrum and variance spectrum. Both spectra can also be stored in an ORTEC SPC format file structure for future comparison. Users can easily switch between corrected and uncorrected spectra through simple menu commands in GammaVision and MAESTRO.
The ORTEC ZDT model includes uncertainty estimation algorithms that further enhance our ZDT approach. While other "lossless counting" methods cannot calculate the uncertainty associated with the counts (which are added to this part of the spectrum), the ZDT mode in DSPEC jr 2.0 can generate both the corrected spectrum and the uncertainty when collecting the data. For more information on ZDT, see Application Note 56, "Lossless Counting for Uncertainty Analysis Using ORTEC's Innovative Zero Dead Time Technology."
Low Frequency Noise Suppressor Digital Filter Improves Resolution in Mechanical Cooling Systems!
The LFR is designed to eliminate microphonic noise in the output signal of a high-purity germanium detector. What results are you expecting? If your mechanical cooling system has a low resolution, LFR can significantly increase its resolution.
ballistic loss correction
Using ORTEC's digital signal processing DSPEC product series, there is no need to worry about ballistic loss. In larger HPGe detectors, the so-called ballistic loss effect sometimes occurs. This often results in poor resolution, especially for high-energy peaks. In analog systems, ballistic deficits are typically corrected using gated integrating amplifiers or via resolution enhancer modules. In digital systems, however, a simple adjustment of the flat-top width of the digital filter is sufficient.
Using InSight mode in DSPEC jr 2.0, operators can adjust the flattop width (and tilt) and immediately see the effects of signal processing. In most cases, with very large detectors (such as the 207% efficient detector used in this example!), a flat-top setting of 0.8 μs is sufficient to restore excellent resolution.
Simple shaping parameter settings
DSPEC jr 2.0 helps you maintain control of your digital systems. Rise time and flat top width adjustments allow you to "fine tune" the performance of your spectrometer to your application. Optimizing resolution and throughput has never been easier!
In DSPEC jr 2.0, in addition to the tilt parameters, there are 112 rise times (from 0.8 to 23 μs in 0.2 increments) and 22 flat top widths (from 0.3 to 2.4 μs in 0.1 increments), giving you over 2,000 parameter combinations.
Please rest assured. .. We still offer an automatic "optimize" function in the control panel so that you can choose the most suitable parameters! This means that detector resolution and throughput can be improved with just a click of the mouse.
SMART-1™ enables quality data
ORTEC's SMART-1 detector is very smart. They monitor and store detector "health" (detector temperature, preamplifier power, bias overrange, bias on/off status). A single check of DSPEC jr 2.0 will verify that the detector is primed and ready to collect. During the acquisition process, the SMART-1 detector continuously monitors the "state of health" (SOH) to ensure the integrity of the collected data. At the end of the acquisition, a quick check of the SOH markers in the SMART-1 detector will then show whether any parameters deviated from specification during the measurement. This is critical for environmental samples that require long-term counting and regulatory samples that require data integrity.
Another big advantage is that the SMART-1 detector comes preset at the factory with recommended bias values. You no longer need to look at the manual or label on the detector to set the correct bias value. As soon as the DSPEC jr 2.0 is turned on, the SMART-1 detector automatically detects the detector temperature, determines the correct high voltage bias and turns it on.
Convenient single cable connection to detector
The ORTEC DIM (Detector Interface Module) used by DSPEC jr 2.0 connects DSPEC jr 2.0 and the detector with only one cable. The DIM provides bias for the proximity detector so that only the signal and low voltage power are carried in the cable. Possible dangers due to long cables carrying high voltages are now eliminated.
Show important parameters
DSPEC jr 2.0 displays important system parameters on the front panel LCD display. DSPEC jr 2.0 will display the instrument ID, name, serial number, preset counting conditions, current live and real time, dead time percentage, input count rate, HV status and value, and the serial number of the SMART-1 detector.
compact
The DSPEC jr 2.0 occupies an area equivalent to that of a desk calendar and can be placed directly on the desktop. Lightweight and strong, multiple DSPEC jr 2.0s can be stacked together, with their housings interlocking, so there's no need to worry about sliding or tilting.
Combine freely with existing MCB
ORTEC CONNECTIONS software supports any combination and number of USB devices connected to any computer. For example, two digiDARTs can be connected to the same PC using a USB hub along with two DSPEC jr 2.0. Any number of other ORTEC MCBs can be connected to the same system via network, printer port, RS-232, or dual-port memory.
Add a sampler
If you are ready to automate your process with an integrated sample changer, the DSPEC jr 2.0 has you covered with its built-in sample changer interface and controls.
...still as easy to set up as ever!
DSPEC instruments are easy to set up and use. With intelligent MCA control, there is no need for manual configuration or even a so-called wizard. You simply install the software (such as GammaVision or MAESTRO) and the software "knows" which control panel it needs to display. The panel's tabular design logically groups the controls and functions available on DSPEC jr 2.0.
DSPEC jr 2.0 includes ORTEC’s digital auto-pole zero circuitry, digital auto-baseline recovery and optimization features that allow for selectable flat top/tilt settings for the detector currently connected to DSPEC jr 2.0, making spectral measurement system setup and optimization incredibly easy.
Of course, one of the innovative features of our products is InSight™, the built-in virtual digital oscilloscope. Using the InSight feature, you can easily see the effect of changing flat top width, baseline recovery settings or examine the effect of ballistic loss correction (see sidebar). No more need for a heavy and cumbersome external oscilloscope. No special software is required. Just open Control Panel and turn on InSight mode.
